Download Advances in Electronic Testing: Challenges and Methodologies by Dimitris Gizopoulos PDF

By Dimitris Gizopoulos

This is a brand new form of edited quantity within the Frontiers in digital checking out ebook sequence dedicated to fresh advances in digital circuits trying out. The e-book is a accomplished elaboration on vital themes which trap significant study and improvement efforts this present day. "Hot" themes of present curiosity to check know-how neighborhood were chosen, and the authors are key participants within the corresponding topics.

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As a simple example, 01, 10, and 11 constitute a complete single stuck-at test set for a two input NAND gate, with each of three basic stuck-at faults failing one of the patterns. g. an NFET transistor gate shorted to the cell output can potentially fail all 4 input patterns. 13 A Defect-Oriented test strategy begins with a decision to use Defect-Oriented methods as the basis for production test. This leads to decisions about which tests to include, and this is the subject of this section. Advances in Electronic Testing: Challenges and Methodologies 29 In general, a threefold approach is best: ƒ First, logic tests are a key part of any test methodology.

These shorts will be more of a concern for diagnosis than for bridging ATPG, which should try to sensitize them the conventional way (opposite values). 2V “0” 0V Figure 1-11: Faulty behavior with multiple VDD values bridged. 14 Chapter 1 – Defect-Oriented Testing Defects in the level shifters themselves cannot be avoided, but careful attention needs to be paid in layout in order to ensure that they result in catastrophic (easily measurable) failures, rather than subtle problems that might escape detection during manufacturing test.

Around 1990, HP also began investigating IDDQ tests in production. These tests tended to fail numerous parts, so effectiveness questions were equally important. Many of the results of HP’s studies have been published. Some of the key ones are [31], [36] [37] and [38]. 1 Fault Coverage, Scan vs. Functional Fault coverage has always been used as an approximation of defect coverage. An interesting series of studies was carried out at HP to determine the relationship between different types of fault coverage and defect coverage, as measured by both test escapes and fallout.

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